Wael Louis Nackasha is an associate at Ridout & Maybee LLP in the firm’s Toronto office. His practice focuses on patent and trademark prosecution. He drafts and prosecutes patents in the areas of electrical, computer, machine learning, telecommunication, and computer-related technology.
Wael has several years of industrial and academic experience as a research scientist and programmer. With a P.Eng designation, he is also a member of the Professional Engineers of Ontario and completed his M.Sc. and Ph.D in Electrical and Computer Engineering, focusing on artificial intelligence, at the University of Toronto.
Wael has also published papers in national and international conferences and journals in the areas of machine learning, biometrics, computer vision, signal and image processing, and statistical signal processing.
He has experience in programming, including Python, Matlab, R, C/C++, Java, assembly language, and has had some exposure to PHP, HTML, as well as FPGA programming. He stays up to date with the state of the art of research in his areas of expertise and is currently a reviewer for multiple journals.
While not working, he spends his time with his wife and two little girls. If he has any time left, he likes to spend it outdoors.
- B.Eng.(Electrical Engineering), Ryerson University
- M.A.Sc. (Electrical and Computer Engineering), University of Toronto
- Ph.D (Doctor of Philosophy, Electrical and Computer Engineering)
- J.D., Osgoode Hall Law School, York University
- Professional Engineers of Ontario (Member)
- Golden Key International Honour Society (Member)
Wael Louis and K.N. Plataniotis, "Co-occurrence of Local Binary Patterns (CoLBP) Features for Frontal Face Detection in Surveillance Applications", EURASIP Journal on Image and Video Processing: Special Issue on Advanced Video-Based Surveillance, 2010.
Wael Louis and K.N. Plataniotis,"Weakly Trained Dual Features Extraction Based Detector for Frontal Face Detection", IEEE International Conference on Acoustics, Speech, and Signal Processing, ICASSP 2010.
Wael Louis, K.N. Plataniotis, and Yong Man Ro, "Enhanced Weakly Trained Frontal Face Detector for Surveillance Purposes", IEEE World Congress On Computational Intelligence, WCCI 2010.
Wael Louis and K.N. Plataniotis, "Frontal Face Detection for Surveillance Purposes Using Dual Local Binary Patterns Features", IEEE International Conference on Image Processing, ICIP 2010.